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"Dynamic fault collapsing and diagnostic test pattern generation for ..."

Vamsi Boppana, W. Kent Fuchs (1998)

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DOI: 10.1145/288548.288593

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iccad/BoppanaF98
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/BoppanaF98
Vamsi Boppana, W. Kent Fuchs:
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits. ICCAD 1998: 147-154

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