BibTeX record conf/ftcs/HuangAL92

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@inproceedings{DBLP:conf/ftcs/HuangAL92,
  author       = {Kaiyuan Huang and
                  Vinod K. Agarwal and
                  Laurence E. LaForge},
  title        = {Wafer Testing with Pairwise Comparisons},
  booktitle    = {Digest of Papers: FTCS-22, The Twenty-Second Annual International
                  Symposium on Fault-Tolerant Computing, Boston, Massachusetts, USA,
                  July 8-10, 1992},
  pages        = {374--383},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/FTCS.1992.243563},
  doi          = {10.1109/FTCS.1992.243563},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/ftcs/HuangAL92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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