BibTeX record conf/ets/WuRMTMYCHK19

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@inproceedings{DBLP:conf/ets/WuRMTMYCHK19,
  author       = {Lizhou Wu and
                  Siddharth Rao and
                  Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Erik Jan Marinissen and
                  Farrukh Yasin and
                  Sebastien Couet and
                  Said Hamdioui and
                  Gouri Sankar Kar},
  title        = {Pinhole Defect Characterization and Fault Modeling for {STT-MRAM}
                  Testing},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791518},
  doi          = {10.1109/ETS.2019.8791518},
  timestamp    = {Tue, 07 May 2024 20:06:33 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/WuRMTMYCHK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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