BibTeX record conf/ets/NairMT20

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@inproceedings{DBLP:conf/ets/NairMT20,
  author       = {Sarath Mohanachandran Nair and
                  Christopher M{\"{u}}nch and
                  Mehdi Baradaran Tahoori},
  title        = {Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
                  25-29, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ETS48528.2020.9131582},
  doi          = {10.1109/ETS48528.2020.9131582},
  timestamp    = {Wed, 15 Jul 2020 13:24:18 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/NairMT20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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