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BibTeX record conf/ets/AbufalghaB17
@inproceedings{DBLP:conf/ets/AbufalghaB17, author = {Mohamed A. Abufalgha and Alex Bystrov}, title = {Derivation of the reliability metric for digital circuits}, booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus, May 22-26, 2017}, pages = {1--2}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ETS.2017.7968224}, doi = {10.1109/ETS.2017.7968224}, timestamp = {Sat, 30 Sep 2023 09:40:34 +0200}, biburl = {https://dblp.org/rec/conf/ets/AbufalghaB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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