BibTeX record conf/essderc/RrustemiVJTVLCM21

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@inproceedings{DBLP:conf/essderc/RrustemiVJTVLCM21,
  author       = {B. Rrustemi and
                  Aby{-}Ga{\"{e}}l Viey and
                  Marie{-}Anne Jaud and
                  Fran{\c{c}}ois Triozon and
                  William Vandendaele and
                  Charles Leroux and
                  Jacques Cluzel and
                  S. Martin and
                  Cyrille Le Royer and
                  Romain Gwoziecki and
                  Roberto Modica and
                  Ferdinando Iucolano and
                  Fred Gaillard and
                  Thierry Poiroux and
                  G{\'{e}}rard Ghibaudo},
  title        = {Reliable method for low field temperature dependent mobility extraction
                  at Al2O3/GaN interface},
  booktitle    = {51st {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2021, Grenoble, France, September 13-22, 2021},
  pages        = {295--298},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ESSDERC53440.2021.9631766},
  doi          = {10.1109/ESSDERC53440.2021.9631766},
  timestamp    = {Mon, 08 Jul 2024 08:23:15 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/RrustemiVJTVLCM21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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