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"Reliable method for low field temperature dependent mobility extraction at ..."

B. Rrustemi et al. (2021)

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DOI: 10.1109/ESSDERC53440.2021.9631766

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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  dblp key:
  - conf/essderc/RrustemiVJTVLCM21
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  - https://dblp.org/rec/conf/essderc/RrustemiVJTVLCM21
B. Rrustemi, Aby-Gaël Viey, Marie-Anne Jaud, François Triozon, William Vandendaele, Charles Leroux, Jacques Cluzel, S. Martin, C. Le Royer, Romain Gwoziecki, Roberto Modica, Ferdinando Iucolano, Fred Gaillard, Thierry Poiroux, Gérard Ghibaudo:
Reliable method for low field temperature dependent mobility extraction at Al2O3/GaN interface. ESSDERC 2021: 295-298

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