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BibTeX record conf/essderc/LavievilleKTBDG16
@inproceedings{DBLP:conf/essderc/LavievilleKTBDG16, author = {R. Lavieville and Theano A. Karatsori and Christoforos G. Theodorou and Sylvain Barraud and C. A. Dimitriadis and G{\'{e}}rard Ghibaudo}, title = {Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs}, booktitle = {46th European Solid-State Device Research Conference, {ESSDERC} 2016, Lausanne, Switzerland, September 12-15, 2016}, pages = {142--145}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/ESSDERC.2016.7599607}, doi = {10.1109/ESSDERC.2016.7599607}, timestamp = {Mon, 03 Jan 2022 22:21:42 +0100}, biburl = {https://dblp.org/rec/conf/essderc/LavievilleKTBDG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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