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"Statistical characterization of drain current local and global variability ..."

R. Lavieville et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599607

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/essderc/LavievilleKTBDG16
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  - https://dblp.org/rec/conf/essderc/LavievilleKTBDG16
R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo:
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. ESSDERC 2016: 142-145

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