![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/essderc/KaczerFWRBCDLGK15
@inproceedings{DBLP:conf/essderc/KaczerFWRBCDLGK15, author = {Ben Kaczer and Jacopo Franco and Pieter Weckx and Philippe Roussel and Erik Bury and Moonju Cho and Robin Degraeve and Dimitri Linten and Guido Groeseneken and Halil Kukner and Praveen Raghavan and Francky Catthoor and Gerhard Rzepa and Wolfgang G{\"{o}}s and Tibor Grasser}, title = {The defect-centric perspective of device and circuit reliability - From individual defects to circuits}, booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015, Graz, Austria, September 14-18, 2015}, pages = {218--225}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ESSDERC.2015.7324754}, doi = {10.1109/ESSDERC.2015.7324754}, timestamp = {Sat, 19 Oct 2019 20:10:45 +0200}, biburl = {https://dblp.org/rec/conf/essderc/KaczerFWRBCDLGK15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.