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BibTeX record conf/drc/YenTLYL20
@inproceedings{DBLP:conf/drc/YenTLYL20, author = {Chia{-}Chun Yen and An{-}Hung Tai and Yu{-}Chieh Liu and Chun{-}Hung Yeh and C. W. Liu}, title = {Mobility Enhancement and Reliability Characterization of Back-Channel-Etch Amorphous InGaZnO {TFT} with Double Layers}, booktitle = {2020 Device Research Conference, {DRC} 2020, Columbus, OH, USA, June 21-24, 2020}, pages = {1--2}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/DRC50226.2020.9135180}, doi = {10.1109/DRC50226.2020.9135180}, timestamp = {Mon, 27 Jul 2020 12:08:03 +0200}, biburl = {https://dblp.org/rec/conf/drc/YenTLYL20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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