BibTeX record conf/drc/YenTLYL20

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@inproceedings{DBLP:conf/drc/YenTLYL20,
  author       = {Chia{-}Chun Yen and
                  An{-}Hung Tai and
                  Yu{-}Chieh Liu and
                  Chun{-}Hung Yeh and
                  C. W. Liu},
  title        = {Mobility Enhancement and Reliability Characterization of Back-Channel-Etch
                  Amorphous InGaZnO {TFT} with Double Layers},
  booktitle    = {2020 Device Research Conference, {DRC} 2020, Columbus, OH, USA, June
                  21-24, 2020},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DRC50226.2020.9135180},
  doi          = {10.1109/DRC50226.2020.9135180},
  timestamp    = {Mon, 27 Jul 2020 12:08:03 +0200},
  biburl       = {https://dblp.org/rec/conf/drc/YenTLYL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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