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"Mobility Enhancement and Reliability Characterization of Back-Channel-Etch ..."
Chia-Chun Yen et al. (2020)
- Chia-Chun Yen, An-Hung Tai, Yu-Chieh Liu, Chun-Hung Yeh, C. W. Liu:
Mobility Enhancement and Reliability Characterization of Back-Channel-Etch Amorphous InGaZnO TFT with Double Layers. DRC 2020: 1-2
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