BibTeX record conf/drc/MiyaoTIINISTU22

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@inproceedings{DBLP:conf/drc/MiyaoTIINISTU22,
  author       = {Tomohisa Miyao and
                  Takahisa Tanaka and
                  Itsuki Imanishi and
                  Masayuki Ichikawa and
                  Shuya Nakagawa and
                  Hiroki Ishikuro and
                  Toshitsugu Sakamoto and
                  Munehiro Tada and
                  Ken Uchida},
  title        = {Enhanced Drain Current in Transient Mode due to Long Ionization Time
                  of Shallow Impurities at 4 {K} in 65-nm bulk Cryo {CMOS} Transistors},
  booktitle    = {Device Research Conference, {DRC} 2022, Columbus, OH, USA, June 26-29,
                  2022},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DRC55272.2022.9855815},
  doi          = {10.1109/DRC55272.2022.9855815},
  timestamp    = {Sun, 12 Nov 2023 02:14:57 +0100},
  biburl       = {https://dblp.org/rec/conf/drc/MiyaoTIINISTU22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}