BibTeX record conf/dphoto/El-Yamany17

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@inproceedings{DBLP:conf/dphoto/El-Yamany17,
  author       = {Noha A. El{-}Yamany},
  editor       = {Zhen He and
                  Feng Li and
                  Jon S. McElvain},
  title        = {Robust Defect Pixel Detection and Correction for Bayer Imaging Systems},
  booktitle    = {Digital Photography and Mobile Imaging XIII, Burlingame, CA, USA,
                  January 29 - February 2, 2017},
  pages        = {46--51},
  publisher    = {Society for Imaging Science and Technology},
  year         = {2017},
  url          = {https://doi.org/10.2352/ISSN.2470-1173.2017.15.DPMI-088},
  doi          = {10.2352/ISSN.2470-1173.2017.15.DPMI-088},
  timestamp    = {Thu, 20 Jul 2023 16:45:52 +0200},
  biburl       = {https://dblp.org/rec/conf/dphoto/El-Yamany17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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