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"Robust Defect Pixel Detection and Correction for Bayer Imaging Systems."

Noha A. El-Yamany (2017)

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DOI: 10.2352/ISSN.2470-1173.2017.15.DPMI-088

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-20

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  dblp key:
  - conf/dphoto/El-Yamany17
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  - https://dblp.org/rec/conf/dphoto/El-Yamany17
Noha A. El-Yamany:
Robust Defect Pixel Detection and Correction for Bayer Imaging Systems. Digital Photography and Mobile Imaging 2017: 46-51

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