BibTeX record conf/dft/OlowogemoQLRL22

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@inproceedings{DBLP:conf/dft/OlowogemoQLRL22,
  author       = {Semiu A. Olowogemo and
                  Hao Qiu and
                  Bor{-}Tyng Lin and
                  William H. Robinson and
                  Daniel B. Limbrick},
  editor       = {Luca Cassano and
                  Sreejit Chakravarty and
                  Alberto Bosio},
  title        = {Model-Based Analysis of Single-Event Upset {(SEU)} Vulnerability of
                  6T {SRAM} Using FinFET Technologies},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21,
                  2022},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DFT56152.2022.9962348},
  doi          = {10.1109/DFT56152.2022.9962348},
  timestamp    = {Sat, 03 Dec 2022 16:36:45 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/OlowogemoQLRL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}