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"Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM ..."

Semiu A. Olowogemo et al. (2022)

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DOI: 10.1109/DFT56152.2022.9962348

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-03

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  dblp key:
  - conf/dft/OlowogemoQLRL22
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Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick:
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies. DFT 2022: 1-4

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