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BibTeX record conf/dft/LiuGTRL22
@inproceedings{DBLP:conf/dft/LiuGTRL22, author = {Shanshan Liu and Jing Guo and Xiaochen Tang and Pedro Reviriego and Fabrizio Lombardi}, editor = {Luca Cassano and Sreejit Chakravarty and Alberto Bosio}, title = {A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance}, booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21, 2022}, pages = {1--6}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/DFT56152.2022.9962346}, doi = {10.1109/DFT56152.2022.9962346}, timestamp = {Wed, 10 May 2023 21:51:47 +0200}, biburl = {https://dblp.org/rec/conf/dft/LiuGTRL22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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