"A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset ..."

Shanshan Liu et al. (2022)

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DOI: 10.1109/DFT56152.2022.9962346

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-10

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Shanshan Liu, Jing Guo, Xiaochen Tang, Pedro Reviriego, Fabrizio Lombardi:
A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance. DFT 2022: 1-6

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