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BibTeX record conf/date/Weis0ESVGKW15
@inproceedings{DBLP:conf/date/Weis0ESVGKW15, author = {Christian Weis and Matthias Jung and Peter Ehses and Cristiano Santos and Pascal Vivet and Sven Goossens and Martijn Koedam and Norbert Wehn}, editor = {Wolfgang Nebel and David Atienza}, title = {Retention time measurements and modelling of bit error rates of {WIDE} {I/O} {DRAM} in MPSoCs}, booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March 9-13, 2015}, pages = {495--500}, publisher = {{ACM}}, year = {2015}, url = {http://dl.acm.org/citation.cfm?id=2755865}, timestamp = {Mon, 09 Aug 2021 01:32:18 +0200}, biburl = {https://dblp.org/rec/conf/date/Weis0ESVGKW15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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