BibTeX record conf/date/KraakATHWCC18

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@inproceedings{DBLP:conf/date/KraakATHWCC18,
  author       = {Daniel Kraak and
                  Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor},
  editor       = {Jan Madsen and
                  Ayse K. Coskun},
  title        = {Degradation analysis of high performance 14nm FinFET {SRAM}},
  booktitle    = {2018 Design, Automation {\&} Test in Europe Conference {\&}
                  Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages        = {201--206},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.23919/DATE.2018.8342003},
  doi          = {10.23919/DATE.2018.8342003},
  timestamp    = {Mon, 30 Sep 2024 15:20:52 +0200},
  biburl       = {https://dblp.org/rec/conf/date/KraakATHWCC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}