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BibTeX record conf/dac/HuWYYW21
@inproceedings{DBLP:conf/dac/HuWYYW21, author = {Wenfei Hu and Zhikai Wang and Sen Yin and Zuochang Ye and Yan Wang}, title = {Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation}, booktitle = {58th {ACM/IEEE} Design Automation Conference, {DAC} 2021, San Francisco, CA, USA, December 5-9, 2021}, pages = {895--900}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/DAC18074.2021.9586136}, doi = {10.1109/DAC18074.2021.9586136}, timestamp = {Tue, 02 Aug 2022 22:23:51 +0200}, biburl = {https://dblp.org/rec/conf/dac/HuWYYW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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