BibTeX record conf/dac/HuWYYW21

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@inproceedings{DBLP:conf/dac/HuWYYW21,
  author       = {Wenfei Hu and
                  Zhikai Wang and
                  Sen Yin and
                  Zuochang Ye and
                  Yan Wang},
  title        = {Sensitivity Importance Sampling Yield Analysis and Optimization for
                  High Sigma Failure Rate Estimation},
  booktitle    = {58th {ACM/IEEE} Design Automation Conference, {DAC} 2021, San Francisco,
                  CA, USA, December 5-9, 2021},
  pages        = {895--900},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/DAC18074.2021.9586136},
  doi          = {10.1109/DAC18074.2021.9586136},
  timestamp    = {Tue, 02 Aug 2022 22:23:51 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/HuWYYW21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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