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"Sensitivity Importance Sampling Yield Analysis and Optimization for High ..."

Wenfei Hu et al. (2021)

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DOI: 10.1109/DAC18074.2021.9586136

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-02

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Wenfei Hu, Zhikai Wang, Sen Yin, Zuochang Ye, Yan Wang:
Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation. DAC 2021: 895-900

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