BibTeX record conf/csreaESA/HanL04

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@inproceedings{DBLP:conf/csreaESA/HanL04,
  author       = {Yinhe Han and
                  Xiaowei Li},
  editor       = {Hamid R. Arabnia and
                  Minyi Guo and
                  Laurence Tianruo Yang},
  title        = {Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based
                  Test},
  booktitle    = {Proceedings of the International Conference on Embedded Systems and
                  Applications, {ESA} '04 {\&} Proceedings of the International
                  Conference on VLSI, {VLSI} '04, June 21-24, 2004, Las Vegas, Nevada,
                  {USA}},
  pages        = {374--381},
  publisher    = {{CSREA} Press},
  year         = {2004},
  timestamp    = {Tue, 23 May 2023 16:44:00 +0200},
  biburl       = {https://dblp.org/rec/conf/csreaESA/HanL04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}