"Simultaneous Reduction of Test Data Volume and Testing Power for ..."

Yinhe Han, Xiaowei Li (2004)

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type: Conference or Workshop Paper

metadata version: 2023-05-23

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Yinhe Han, Xiaowei Li:
Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test. ESA/VLSI 2004: 374-381

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