BibTeX record conf/cicc/DeguchiNKT17

download as .bib file

@inproceedings{DBLP:conf/cicc/DeguchiNKT17,
  author       = {Yoshiaki Deguchi and
                  Toshiki Nakamura and
                  Atsuro Kobayashi and
                  Ken Takeuchi},
  title        = {12{\texttimes} bit-error acceptable, 300{\texttimes} extended data-retention
                  time, value-aware {SSD} with vertical 3D-TLC {NAND} flash memories
                  for image recognition},
  booktitle    = {2017 {IEEE} Custom Integrated Circuits Conference, {CICC} 2017, Austin,
                  TX, USA, April 30 - May 3, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/CICC.2017.7993687},
  doi          = {10.1109/CICC.2017.7993687},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/DeguchiNKT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.