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"12× bit-error acceptable, 300× extended data-retention time, ..."
Yoshiaki Deguchi et al. (2017)
- Yoshiaki Deguchi
, Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi:
12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition. CICC 2017: 1-4
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