BibTeX record conf/ats/UedaSIS20

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@inproceedings{DBLP:conf/ats/UedaSIS20,
  author       = {Aoi Ueda and
                  Michihiro Shintani and
                  Michiko Inoue and
                  Takashi Sato},
  title        = {Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs
                  under Switching Operation},
  booktitle    = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
                  23-26, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ATS49688.2020.9301598},
  doi          = {10.1109/ATS49688.2020.9301598},
  timestamp    = {Tue, 07 May 2024 20:12:45 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/UedaSIS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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