"Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under ..."

Aoi Ueda et al. (2020)

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DOI: 10.1109/ATS49688.2020.9301598

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Aoi Ueda, Michihiro Shintani, Michiko Inoue, Takashi Sato:
Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. ATS 2020: 1-6

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