BibTeX record conf/ats/HurSLSLK96

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@inproceedings{DBLP:conf/ats/HurSLSLK96,
  author       = {Y.{-}M. Hur and
                  J.{-}H. Shin and
                  K.{-}H. Lee and
                  Y.{-}S. Son and
                  I.{-}C. Lim and
                  Y.{-}H. Kim},
  title        = {Efficient Path Delay Fault Test Generation Algorithms for Weighted
                  Random Robust Testing},
  booktitle    = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
                  Taiwan},
  pages        = {42},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.ieeecomputersociety.org/10.1109/ATS.1996.10002},
  doi          = {10.1109/ATS.1996.10002},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HurSLSLK96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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