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"Efficient Path Delay Fault Test Generation Algorithms for Weighted Random ..."
Y.-M. Hur et al. (1996)
- Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim:
Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42-
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