BibTeX record conf/ats/Hachiya20

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@inproceedings{DBLP:conf/ats/Hachiya20,
  author       = {Koutaro Hachiya},
  title        = {A Method to Detect Open Defects in Wire Segments of On-Chip Power
                  Grids},
  booktitle    = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
                  23-26, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ATS49688.2020.9301528},
  doi          = {10.1109/ATS49688.2020.9301528},
  timestamp    = {Fri, 15 Jan 2021 14:54:21 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Hachiya20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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