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"A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids."

Koutaro Hachiya (2020)

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DOI: 10.1109/ATS49688.2020.9301528

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-15

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Koutaro Hachiya:
A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids. ATS 2020: 1-6

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