BibTeX record conf/ast/RasheedDT23

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@inproceedings{DBLP:conf/ast/RasheedDT23,
  author       = {Shawn Rasheed and
                  Jens Dietrich and
                  Amjed Tahir},
  title        = {On the Effect of Instrumentation on Test Flakiness},
  booktitle    = {{IEEE/ACM} International Conference on Automation of Software Test,
                  {AST} 2023, Melbourne, Australia, May 15-16, 2023},
  pages        = {123--127},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AST58925.2023.00016},
  doi          = {10.1109/AST58925.2023.00016},
  timestamp    = {Sat, 30 Sep 2023 09:34:51 +0200},
  biburl       = {https://dblp.org/rec/conf/ast/RasheedDT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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