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"On the Effect of Instrumentation on Test Flakiness."

Shawn Rasheed, Jens Dietrich, Amjed Tahir (2023)

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DOI: 10.1109/AST58925.2023.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/ast/RasheedDT23
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  - https://dblp.org/rec/conf/ast/RasheedDT23
Shawn Rasheed, Jens Dietrich, Amjed Tahir:
On the Effect of Instrumentation on Test Flakiness. AST 2023: 123-127

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