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BibTeX record conf/aspdac/HuangSKCT16
@inproceedings{DBLP:conf/aspdac/HuangSKCT16, author = {Xin Huang and Valeriy Sukharev and Taeyoung Kim and Hai{-}Bao Chen and Sheldon X.{-}D. Tan}, title = {Electromigration recovery modeling and analysis under time-dependent current and temperature stressing}, booktitle = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC} 2016, Macao, Macao, January 25-28, 2016}, pages = {244--249}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/ASPDAC.2016.7428018}, doi = {10.1109/ASPDAC.2016.7428018}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/aspdac/HuangSKCT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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