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"Electromigration recovery modeling and analysis under time-dependent ..."
Xin Huang et al. (2016)
- Xin Huang, Valeriy Sukharev
, Taeyoung Kim
, Hai-Bao Chen, Sheldon X.-D. Tan:
Electromigration recovery modeling and analysis under time-dependent current and temperature stressing. ASP-DAC 2016: 244-249
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