BibTeX record conf/apsec/XuSSWYK23

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@inproceedings{DBLP:conf/apsec/XuSSWYK23,
  author       = {Rui Xu and
                  Yuliang Shi and
                  Zhiyuan Su and
                  Xinjun Wang and
                  Zhongmin Yan and
                  Fanyu Kong},
  title        = {Test Case Level Predictive Mutation Testing Combining {PIE} and Natural
                  Language Features},
  booktitle    = {30th Asia-Pacific Software Engineering Conference, {APSEC} 2023, Seoul,
                  Republic of Korea, December 4-7, 2023},
  pages        = {21--30},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/APSEC60848.2023.00012},
  doi          = {10.1109/APSEC60848.2023.00012},
  timestamp    = {Wed, 10 Apr 2024 20:58:45 +0200},
  biburl       = {https://dblp.org/rec/conf/apsec/XuSSWYK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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