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"Test Case Level Predictive Mutation Testing Combining PIE and Natural ..."

Rui Xu et al. (2023)

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DOI: 10.1109/APSEC60848.2023.00012

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-10

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  - conf/apsec/XuSSWYK23
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Rui Xu, Yuliang Shi, Zhiyuan Su, Xinjun Wang, Zhongmin Yan, Fanyu Kong:
Test Case Level Predictive Mutation Testing Combining PIE and Natural Language Features. APSEC 2023: 21-30

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