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BibTeX record conf/amcc/LiuHHCF20
@inproceedings{DBLP:conf/amcc/LiuHHCF20, author = {Yi{-}Lin Liu and Kuan{-}Wei Huang and Ching{-}Chi Huang and Huang{-}Chih Chen and Li{-}Chen Fu}, title = {{AFM} Tip Localization on Large Range Sample Using Particle Filter for {MEMS} Inspection}, booktitle = {2020 American Control Conference, {ACC} 2020, Denver, CO, USA, July 1-3, 2020}, pages = {577--582}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.23919/ACC45564.2020.9147562}, doi = {10.23919/ACC45564.2020.9147562}, timestamp = {Sun, 08 Aug 2021 01:40:57 +0200}, biburl = {https://dblp.org/rec/conf/amcc/LiuHHCF20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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