BibTeX record books/crc/14/PengYT14

download as .bib file

@incollection{DBLP:books/crc/14/PengYT14,
  author       = {Ke Peng and
                  Mahmut Yilmaz and
                  Mohammad Tehranipoor},
  editor       = {Sandeep Kumar Goel and
                  Krishnendu Chakrabarty},
  title        = {Circuit Path Grading Considering Layout, Process Variations, and Cross
                  Talk},
  booktitle    = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits},
  pages        = {95--118},
  publisher    = {{CRC} Press},
  year         = {2014},
  timestamp    = {Fri, 05 Jun 2020 14:24:19 +0200},
  biburl       = {https://dblp.org/rec/books/crc/14/PengYT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.