"Circuit Path Grading Considering Layout, Process Variations, and Cross Talk."

Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor (2014)

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metadata version: 2020-06-05

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Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor:
Circuit Path Grading Considering Layout, Process Variations, and Cross Talk. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 95-118

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