R. D. (Shawn) Blanton

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Yen-Tzu Lin

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Publications

2012
[j26]
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Yen-Tzu Lin, Osei Poku, R. D. (Shawn) Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar:
Physically-Aware N-Detect Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(2): 308-321 (2012)
2011
[j21]
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  - journals/tcad/LinB11
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Yen-Tzu Lin, R. D. (Shawn) Blanton:
METER: Measuring Test Effectiveness Regionally. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(7): 1058-1071 (2011)
2009
[c59]
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  - conf/itc/LinB09
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Yen-Tzu Lin, Ronald D. Blanton:
Test effectiveness evaluation through analysis of readily-available tester data. ITC 2009: 1-10
[c58]
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  - conf/vts/YuLTPB09
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Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton:
Controlling DPPM through Volume Diagnosis. VTS 2009: 134-139
[c57]
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  - conf/vts/LinEB09
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Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton:
Physically-Aware N-Detect Test Relaxation. VTS 2009: 197-202
2008
[c52]
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  - conf/date/LinPBB08
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Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton:
Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639
[c49]
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Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar:
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. ITC 2008: 1-9

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