Salvador Mir

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Benoît Charlot

> Home > Persons > Salvador Mir

Publications

2004
[c21]
- view
  authority control:
- export record
  dblp key:
  - conf/socc/MirCRC04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/socc/MirCRC04
Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois:
On-chip testing of embedded silicon transducers. SoCC 2004: 13-18
2003
[j8]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/RomanMC03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/RomanMC03
Cosmin Roman, Salvador Mir, Benoît Charlot:
Building an analogue fault simulation tool and its application to MEMS. Microelectron. J. 34(10): 897-906 (2003)
2001
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/et/CharlotMPC01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/CharlotMPC01
Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electron. Test. 17(6): 459-470 (2001)
[c16]
- no documents available
  - no references & citations available
- export record
  dblp key:
  - conf/latw/CourtoisMCL01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/CourtoisMCL01
Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski:
An Analog-based Approach for MEMS Testing. LATW 2001: 200-203
[c15]
- view
  authority control:
- export record
  dblp key:
  - conf/vts/CharlotMPC01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/CharlotMPC01
Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
2000
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/et/MirCC00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/MirCC00
Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending Fault-Based Testing to Microelectromechanical Systems. J. Electron. Test. 16(3): 279-288 (2000)
[c14]
- view
  authority control:
- export record
  dblp key:
  - conf/glvlsi/MirCNCPZCJR00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/MirCNCPZCJR00
Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz:
Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
1999
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/dt/MirC99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/MirC99
Salvador Mir, Benoît Charlot:
On the Integration of Design and Test for Chips Embedding MEMS. IEEE Des. Test Comput. 16(4): 28-38 (1999)
[c13]
- view
  authority control:
- export record
  dblp key:
  - conf/ets/MirCC99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/MirCC99
Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending fault-based testing to microelectromechanical systems. ETW 1999: 64-68
[c12]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/CharlotMCLC99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/CharlotMCLC99
Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. ITC 1999: 319-328

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.