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Publication search results
found 94 matches
- 2017
- Magdy Abadir:
An Interview With Semiconductor Pioneer and EDA Visionary Leader Wally Rhines. IEEE Des. Test 34(1): 95-105 (2017) - Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang:
Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification. IEEE Des. Test 34(5): 5-6 (2017) - John Adler, Andreas G. Veneris:
Leveraging Software Configuration Management in Automated RTL Design Debug. IEEE Des. Test 34(5): 47-53 (2017) - Mouhamad Alayan, Elisa Vianello, Barbara De Salvo, Luca Perniola, Andrea Padovani, Luca Larcher:
Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM. IEEE Des. Test 34(3): 23-30 (2017) - Michael Alfano, Bryan Black, Jeff Rearick, Joseph Siegel, Michael Su, Julius Din:
Unleashing Fury: A New Paradigm for 3-D Design and Test. IEEE Des. Test 34(1): 8-15 (2017) - Hussam Amrouch, Victor M. van Santen, Jörg Henkel:
Interdependencies of Degradation Effects and Their Impact on Computing. IEEE Des. Test 34(3): 59-67 (2017) - Angelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris:
Trusted Analog/Mixed- Signal/RF ICs: A Survey and a Perspective. IEEE Des. Test 34(6): 63-76 (2017) - David Atienza, Giorgio Di Natale:
Report on DATE 2017 in Lausanne. IEEE Des. Test 34(4): 76-77 (2017) - José L. Ayala:
Code Ocean Is Live: Upload Your Algorithms. IEEE Des. Test 34(3): 108-109 (2017) - José Luis Ayala:
IEEE Rebooting Computing Week. IEEE Des. Test 34(5): 99-100 (2017) - José Luis Ayala:
CEDA Currents. IEEE Des. Test 34(6): 123-124 (2017) - Cristiana Bolchini, Luca Cassano:
A Fully Automated and Configurable Cost-Aware Framework for Adaptive Functional Diagnosis. IEEE Des. Test 34(2): 79-86 (2017) - Gianpiero Cabodi, Paolo Camurati, Sebastiano F. Finocchiaro, Francesco Savarese, Danilo Vendraminetto:
Embedded Systems Secure Path Verification at the Hardware/Software Interface. IEEE Des. Test 34(5): 38-46 (2017) - Alvaro A. Cárdenas:
Corrections. IEEE Des. Test 34(5): 103 (2017) - Francky Catthoor, Guido Groeseneken:
Will Chips of the Future Learn How to Feel Pain and Cure Themselves? IEEE Des. Test 34(5): 80-87 (2017) - Krishnendu Chakrabarty:
Quo Vadis Test? The Past, the Present, and the Future: No Longer a Necessary Evil. IEEE Des. Test 34(3): 93-95 (2017) - Yao-Wen Chang:
An Interview With Professor Chenming Hu, Father of 3D Transistors. IEEE Des. Test 34(5): 90-96 (2017) - Theo Theocharides:
Test Technology TC Newsletter. IEEE Des. Test 34(5): 101-102 (2017) - Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra:
Data-Driven Test Plan Augmentation for Platform Verification. IEEE Des. Test 34(5): 23-29 (2017) - Yiran Chen, Tei-Wei Kuo, Barbara De Salvo:
Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories. IEEE Des. Test 34(3): 6-7 (2017) - Yiran Chen, Hai Helen Li, Ismail Bayram, Enes Eken:
Recent Technology Advances of Emerging Memories. IEEE Des. Test 34(3): 8-22 (2017) - Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang:
Challenges and Trends in Modern SoC Design Verification. IEEE Des. Test 34(5): 7-22 (2017) - Sujit Rokka Chhetri, Mohammad Abdullah Al Faruque:
Side Channels of Cyber-Physical Systems: Case Study in Additive Manufacturing. IEEE Des. Test 34(4): 18-25 (2017) - Scott Davidson:
Research Is Its Own Reward. IEEE Des. Test 34(1): 120 (2017) - Scott Davidson:
Dark Silicon, Antiparallelism, and Too Much Work. IEEE Des. Test 34(2): 104 (2017) - Scott Davidson:
Cyber-Physical System Design With Sensor Networking Technologies. IEEE Des. Test 34(3): 105-107 (2017) - Scott Davidson:
Being Connected. IEEE Des. Test 34(3): 112 (2017) - Scott Davidson:
Practice Makes Perfect. IEEE Des. Test 34(4): 80 (2017) - Scott Davidson:
Engineering Secure Internet of Things Systems. IEEE Des. Test 34(5): 97-98 (2017) - Scott Davidson:
To Verification Infinity and Beyond. IEEE Des. Test 34(5): 104 (2017)
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