- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal"
- exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics"
- boolean and: separate words by space
e.g., codd model
- boolean or: connect words by pipe symbol (|)
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
found 8 matches
- Mahesha Bangalore Ramalinga Pandit, Nitin Varma:
A Deep Introduction to AI Based Software Defect Prediction (SDP) and its Current Challenges. TENCON 2019: 284-290
- Friedrich Hapke, Jürgen Schlöffel:
Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. ETS 2012: 1-6
- John W. Goodby:
Introduction to Defect Textures in Liquid Crystals. Handbook of Visual Display Technology 2012: 1289-1314
- Arbi Ghazarian:
A Case Study of Defect Introduction Mechanisms. CAiSE 2009: 156-170
- Phil Nigh:
Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. IEEE Des. Test Comput. 23(2): 86-87 (2006)
- Jaume Segura, Peter C. Maxwell:
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. 19(5): 5-7 (2002)
- Shinji Fukui:
Introduction of the Software Configuration Management Team and Defect Tracking System for Global Distributed Development. ECSQ 2002: 217-225
- Fabrizio Lombardi, Cecilia Metra:
Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems. IEEE Des. Test Comput. 18(1): 8-9 (2001)
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