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found 3 matches
- Jaan Raik, Raimund Ubar:
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations. J. Electronic Testing 16(3): 213-226 (2000)
- Prasanti Uppaluri, Irith Pomeranz, Sudhakar M. Reddy:
Test Pattern Generation for Path Delay Faults in Synchronous Sequential Circuits Using Multiple Fast Clocks and Multiple Observations Times. FTCS 1994: 456-465
- Todd P. Kelsey, Kewal K. Saluja:
Fast test generation for sequential circuits. ICCAD 1989: 345-347
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