- Debayan Roy, Sumana Ghosh, Qi Zhu, Marco Caccamo, Samarjit Chakraborty:
GoodSpread: Criticality-Aware Static Scheduling of CPS with Multi-QoS Resources. RTSS 2020: 178-190 - Matheus Schuh, Claire Maiza, Joël Goossens, Pascal Raymond, Benoît Dupont de Dinechin:
A study of predictable execution models implementation for industrial data-flow applications on a multi-core platform with shared banked memory. RTSS 2020: 283-295 - Parul Sohal, Rohan Tabish, Ulrich Drepper, Renato Mancuso:
E-WarP: A System-wide Framework for Memory Bandwidth Profiling and Management. RTSS 2020: 345-357 - Miriam García Soto, Pavithra Prabhakar:
Hybridization for Stability Verification of Nonlinear Switched Systems. RTSS 2020: 244-256 - Stephen Tang, James H. Anderson:
Towards Practical Multiprocessor EDF with Affinities. RTSS 2020: 89-101 - Yue Tang, Zhiwei Feng, Nan Guan, Xu Jiang, Mingsong Lv, Qingxu Deng, Wang Yi:
Response Time Analysis and Priority Assignment of Processing Chains on ROS2 Executors. RTSS 2020: 231-243 - Elena Torre, Albert M. K. Cheng:
Work-In-Progress: Fault Tolerance in a Two-State Checkpointing Regularity-Based System. RTSS 2020: 375-378 - Serban Vadineanu, Mitra Nasri:
Robust and Accurate Period Inference using Regression-Based Techniques. RTSS 2020: 358-370 - Reinhard Wilhelm:
Real Time Spent on Real Time. RTSS 2020: 1-2 - Guoqi Xie, Haijie Gong, Yunbo Han, Samarjit Chakraborty, Wanli Chang:
A Real-Time CAN-CAN Gateway with Tight Latency Analysis and Targeted Priority Assignment. RTSS 2020: 141-152 - Lin Zhang, Xin Chen, Fanxin Kong, Alvaro A. Cárdenas:
Real-Time Attack-Recovery for Cyber-Physical Systems Using Linear Approximations. RTSS 2020: 205-217 - Yecheng Zhao, Runzhi Zhou, Haibo Zeng:
An Optimization Framework for Real-Time Systems with Sustainable Schedulability Analysis. RTSS 2020: 333-344 - Zimeng Zhou, Zelin Yun, Chenchen Fu, Chun Jason Xue, Song Han:
Maintaining Real-Time Data Freshness in Wireless Powered Communication Networks. RTSS 2020: 166-177 - 41st IEEE Real-Time Systems Symposium, RTSS 2020, Houston, TX, USA, December 1-4, 2020. IEEE 2020, ISBN 978-1-7281-8324-4 [contents]