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@inproceedings{DBLP:conf/mtdt/Azimane06,
  author       = {Mohamed Azimane},
  title        = {High-Quality Memory Test},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.17},
  doi          = {10.1109/MTDT.2006.17},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Azimane06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/GyonjyanHV06,
  author       = {T. A. Gyonjyan and
                  Gurgen Harutunyan and
                  Valery A. Vardanian},
  title        = {A March-Based Algorithm for Location and Full Diagnosis of All Unlinked
                  Static Faults},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {9--14},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.5},
  doi          = {10.1109/MTDT.2006.5},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/GyonjyanHV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/HsiaoCTC06,
  author       = {Shen{-}Fu Hsiao and
                  Yo{-}Chi Chen and
                  Ming{-}Yu Tsai and
                  Tze{-}Chong Cheng},
  title        = {Novel Memory Organization and Circuit Designs for Efficient Data Access
                  in Applications of 3D Graphics and Multimedia Coding},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {34--42},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.22},
  doi          = {10.1109/MTDT.2006.22},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/HsiaoCTC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Hsu06,
  author       = {Charles Hsu},
  title        = {Future Prospective of Programmable Logic Non-volatile Device},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.16},
  doi          = {10.1109/MTDT.2006.16},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Hsu06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/HsuHYW06,
  author       = {Mu{-}Hsien Hsu and
                  Yu{-}Tsao Hsing and
                  Jen{-}Chieh Yeh and
                  Cheng{-}Wen Wu},
  title        = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {3--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.13},
  doi          = {10.1109/MTDT.2006.13},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/mtdt/HsuHYW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KuoCKLHKCWHP06,
  author       = {Victor Chao{-}Wei Kuo and
                  Chih{-}Ming Chao and
                  Chih{-}Kai Kang and
                  Li{-}Wei Liu and
                  Tzung{-}Bin Huang and
                  Liang{-}Tai Kuo and
                  Shi{-}Hsien Chen and
                  Houng{-}Chi Wei and
                  Hann{-}Ping Hwang and
                  Saysamone Pittikoun},
  title        = {Detailed Comparisons of Program, Erase and Data Retention Characteristics
                  between {P+-} and N+-Poly {SONOS} {NAND} Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {77--79},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.10},
  doi          = {10.1109/MTDT.2006.10},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KuoCKLHKCWHP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KwaiCCYCHLLSLH06,
  author       = {Ding{-}Ming Kwai and
                  Yung{-}Fa Chou and
                  Meng{-}Fan Chang and
                  Su{-}Meng Yang and
                  Ding{-}Sheng Chen and
                  Min{-}Chung Hsu and
                  Yu{-}Zhen Liao and
                  Shiao{-}Yi Lin and
                  Yu{-}Ling Sung and
                  Chia{-}Hsin Lee and
                  Hsin{-}Kun Hsu},
  title        = {FlexiVia {ROM} Compiler Programmable on Different Via Layers Based
                  on Top Metal Assignment},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {28--33},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.14},
  doi          = {10.1109/MTDT.2006.14},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KwaiCCYCHLLSLH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/KwaiHKCHCSPLCC06,
  author       = {Ding{-}Ming Kwai and
                  Ching{-}Hua Hsiao and
                  Chung{-}Ping Kuo and
                  Chi{-}Hsien Chuang and
                  Min{-}Chung Hsu and
                  Yi{-}Chun Chen and
                  Yu{-}Ling Sung and
                  Hsien{-}Yu Pan and
                  Chia{-}Hsin Lee and
                  Meng{-}Fan Chang and
                  Yung{-}Fa Chou},
  title        = {{SRAM} Cell Current in Low Leakage Design},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {65--70},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.28},
  doi          = {10.1109/MTDT.2006.28},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/KwaiHKCHCSPLCC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Lai06,
  author       = {Jordan Lai},
  title        = {{SRAM} Design Techniques for Sub-nano {CMOS} Technology},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.29},
  doi          = {10.1109/MTDT.2006.29},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Lai06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/LiangT06,
  author       = {Hsing{-}Chung Liang and
                  Le{-}Quen Tzeng},
  title        = {Improved Representatives for Unrepairability Judging and Economic
                  Repair Solutions of Memories},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {15},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.18},
  doi          = {10.1109/MTDT.2006.18},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/LiangT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/LinC06,
  author       = {Jyi{-}Tsong Lin and
                  Mike Chang},
  title        = {A New 1T {DRAM} Cell With Enhanced Floating Body Ef},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {23--27},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.6},
  doi          = {10.1109/MTDT.2006.6},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/LinC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Lu06,
  author       = {Chih{-}Yuan Lu},
  title        = {Non-volatile Semiconductor Memory Technology in Nanotech Era},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.21},
  doi          = {10.1109/MTDT.2006.21},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Lu06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Muhmenthaler06,
  author       = {Peter Muhmenthaler},
  title        = {New on-Chip {DFT} and {ATE} Features for Efficient Embedded Memory
                  Test},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.20},
  doi          = {10.1109/MTDT.2006.20},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Muhmenthaler06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Pai06,
  author       = {Pei{-}Lin Pai},
  title        = {{DRAM} Industry Trend},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.11},
  doi          = {10.1109/MTDT.2006.11},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Pai06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/SharifkhaniJS06,
  author       = {Mohammad Sharifkhani and
                  Shah M. Jahinuzzaman and
                  Manoj Sachdev},
  title        = {Dynamic Data Stability in {SRAM} Cells and Its Implications on Data
                  Stability Tests},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {55--64},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.12},
  doi          = {10.1109/MTDT.2006.12},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/SharifkhaniJS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/ShimizuAHSKYAITI06,
  author       = {Yuui Shimizu and
                  Hisanori Aikawa and
                  Keiji Hosotani and
                  Naoharu Shimomura and
                  Tadashi Kai and
                  Yoshihiro Ueda and
                  Yoshiaki Asao and
                  Yoshihisa Iwata and
                  Kenji Tsuchida and
                  Sumio Ikegawa},
  title        = {{MRAM} Write Error Categorization with {QCKB}},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {43--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.19},
  doi          = {10.1109/MTDT.2006.19},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/ShimizuAHSKYAITI06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/Shirota06,
  author       = {Riichiro Shirota},
  title        = {Roadmap of the Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.27},
  doi          = {10.1109/MTDT.2006.27},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Shirota06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/VollrathSGSJ06,
  author       = {J{\"{o}}rg E. Vollrath and
                  J{\"{u}}rg Schwizer and
                  Marcin Gnat and
                  Ralf Schneider and
                  Bret Johnson},
  title        = {{DDR2} {DRAM} Output Timing Optimization},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {49--54},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.9},
  doi          = {10.1109/MTDT.2006.9},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/VollrathSGSJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/WangMCD06,
  author       = {Hua Wang and
                  Miguel Miranda and
                  Francky Catthoor and
                  Wim Dehaene},
  title        = {On the Combined Impact of Soft and Medium Gate Oxide Breakdown and
                  Process Variability on the Parametric Figures of {SRAM} components},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {71--76},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.23},
  doi          = {10.1109/MTDT.2006.23},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/WangMCD06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/WuCLWLWCHPCK06,
  author       = {Jia{-}Lin Wu and
                  Hua{-}Ching Chien and
                  Chien{-}Wei Liao and
                  Cheng{-}Yen Wu and
                  Chih{-}Yuan Lee and
                  Houng{-}Chi Wei and
                  Shih{-}Hsien Chen and
                  Hann{-}Ping Hwang and
                  Saysamone Pittikoun and
                  Travis Cho and
                  Chin{-}Hsing Kao},
  title        = {Comparison of Electrical and Reliability Characteristics of Different
                  Tunnel Oxides in {SONOS} Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {80--84},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.8},
  doi          = {10.1109/MTDT.2006.8},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/WuCLWLWCHPCK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/X06,
  title        = {Foreword},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.15},
  doi          = {10.1109/MTDT.2006.15},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/X06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/X06a,
  title        = {Organizing Committee},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.24},
  doi          = {10.1109/MTDT.2006.24},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/X06a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/X06b,
  title        = {Program Committee},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.25},
  doi          = {10.1109/MTDT.2006.25},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/X06b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/X06c,
  title        = {Reviewers},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.26},
  doi          = {10.1109/MTDT.2006.26},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/X06c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/mtdt/2006,
  title        = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/11003/proceeding},
  isbn         = {0-7695-2572-5},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/mtdt/2006.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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