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@inproceedings{DBLP:conf/latw/0001CV002, author = {Fernanda Lima and Luigi Carro and Raul Velazco and Ricardo Reis}, title = {Injecting Multiple Upsets in a {SEU} tolerant 8051 Micro-controller}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {120--125}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 15:57:25 +0200}, biburl = {https://dblp.org/rec/conf/latw/0001CV002.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/0001FB02, author = {Fabian Vargas and Rubem D. R. Fagundes and Daniel Barros Jr.}, title = {A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {4--10}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/0001FB02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/0002PM02, author = {Eduardo Romero and Gabriela Peretti and Carlos A. Marqu{\'{e}}s}, title = {Oscillation Test Strategy: a Case Study}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {94--98}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/0002PM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/AlexandrescuAN02, author = {Dan Alexandrescu and Lorena Anghel and Michael Nicolaidis}, title = {Simulating Single Event Transients in {VDSM} ICs for Ground Level Radiation}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {126--129}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/AlexandrescuAN02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/AzaisBBCRL02, author = {Florence Aza{\"{\i}}s and Serge Bernard and Yves Bertrand and Mariane Comte and Michel Renovell and Marcelo Lubaszewski}, title = {Estimating Static Parameters of A-to-D Converters from Spectral Analysis}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {174--179}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/AzaisBBCRL02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/BeroulleBLN02, author = {Vincent Beroulle and Yves Bertrand and Laurent Latorre and Pascal Nouet}, title = {Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {99--104}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/BeroulleBLN02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/BonaD02, author = {Luis Carlos Erpen De Bona and Elias Proc{\'{o}}pio Duarte Jr.}, title = {A Flexible Approach for Defining Distributed Dependable Tests in SNMP-based Network Management Systems}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {39--44}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/BonaD02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Bonnaud02, author = {Olivier Bonnaud}, title = {Very Fast Reliability Test at Wafer Level Applied to a {BCD} Technology}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {212}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Bonnaud02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/BonnaudM02, author = {Olivier Bonnaud and Taieb Mohammed{-}Brahim}, title = {Specific Tests of Thin Film Devices for Large Area Electronics}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {194--198}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/BonnaudM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/CalvanoALF02, author = {Jos{\'{e}} Vicente Calvano and Vladimir Castro Alves and Marcelo Lubaszewski and Antonio Carneiro de Mesquita Filho}, title = {Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {83--85}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/CalvanoALF02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/CalvanoFLA02, author = {Jos{\'{e}} Vicente Calvano and Antonio Carneiro de Mesquita Filho and Marcelo Lubaszewski and Vladimir Castro Alves}, title = {State Model Approach for Analog Fault Modeling}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {86--88}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/CalvanoFLA02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/ChauCSP02, author = {Wang Jiang Chau and Paulo S{\'{e}}rgio Cardoso and Marius Strum and Ricardo Pires}, title = {A Comparison Between Test Pattern Generation Strategies for Functional Units in {BIST} Applications}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {61--63}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/ChauCSP02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/ChauGSP02, author = {Wang Jiang Chau and Jose Artur Quilici Gonz{\'{a}}lez and Marius Strum and Ricardo Pires}, title = {{BIST} Plan Optimization and Independent Input Test Register Insertion for Datapath Functional Units}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {64--69}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/ChauGSP02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/ChenWK002, author = {Zhanping Chen and Liqiong Wei and Ali Keshavarzi and Kaushik Roy}, title = {{IDDQ} Testing for Deep Submicron ICs: Challenges and Solutions}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {186--192}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/ChenWK002.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/CotaCOL02, author = {{\'{E}}rika F. Cota and Luigi Carro and Alex Orailoglu and Marcelo Lubaszewski}, title = {Generic and Detailed Search for {TAM} Definition in Core-Based Systems}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {160--164}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/CotaCOL02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Destro-FilhoR02, author = {Jo{\~{a}}o{-}Batista Destro{-}Filho and M. V. Ribeiro}, title = {A Software Technique for Fault-Tolerant Adaptive Circuits in Spatial Applications}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {26--31}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Destro-FilhoR02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/EbadiI02, author = {Zahra Sadat Ebadi and Andr{\'{e}} Ivanov}, title = {Design of an Optimal Test Access Architecture under Power and Place-and-Route Constraints Using {GA}}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {154--159}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/EbadiI02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/FerreyraMGVF02, author = {Pablo A. Ferreyra and Carlos A. Marqu{\'{e}}s and Javier P. Gaspar and Raul Velazco and Ricardo T. Ferreyra}, title = {SEU-Induced-Fault Detection-Efficiency of a Watch Dog Circuit for a Micro-Satellite on Board Digital Signal Processor System}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {106--108}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/FerreyraMGVF02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Fouillat02, author = {Pascal Fouillat}, title = {Laser Utilization for Various Testing Purposes}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {130}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Fouillat02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/GericotaA02, author = {Manuel G. Gericota and Gustavo R. Alves}, title = {Dynamic Replication: The Core of a Truly Non-Intrusive SRAM-based {FPGA} Structural Concurrent Test Methodology}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {70--75}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/GericotaA02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Giovanini02, author = {Leonardo L. Giovanini}, title = {Fault-Tolerant Predictive Feedback Control}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {11--15}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Giovanini02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/GonsalesLCR02, author = {Alex Gonsales and Marcelo Lubaszewski and Luigi Carro and Michel Renovell}, title = {A New {FPGA} for {DSP} Applications Integrating {BIST} Capabilities}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {76--81}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/GonsalesLCR02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/GuntzelWBP002, author = {Jos{\'{e}} Lu{\'{\i}}s G{\"{u}}ntzel and Gustavo Wilke and M{\'{a}}rcio Bystronski and Ana Cristina Medina Pinto and Ricardo Reis}, title = {A Comparison Between Testability Measures Applied to Complex Gates}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {144--149}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/GuntzelWBP002.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/JuniorNCS02, author = {Ad{\~{a}}o Antonio de Souza Junior and Marcelo Negreiros and Luigi Carro and Altamiro A. Suzim}, title = {Complex Adaptive Signal Processing for Analog Testing}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {166--173}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/JuniorNCS02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/LechugaMMB02, author = {Yolanda Lechuga and Rom{\'{a}}n Mozuelos and Mar Mart{\'{\i}}nez and Salvador Bracho}, title = {Hard-to-Detect Faults by Dinamic Current Sensor in Analogue Circuits}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {180--185}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/LechugaMMB02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/LewisFP02, author = {Dean Lewis and Pascal Fouillat and Vincent Pouget}, title = {Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {109--113}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/LewisFP02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/LiuVA02, author = {Jiang Brandon Liu and Andreas G. Veneris and Magdy S. Abadir}, title = {Efficient and Exact Diagnosis of Multiple Stuck-At Faults}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {132--136}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/LiuVA02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/NunesJ02, author = {Raul Ceretta Nunes and Ingrid Jansch{-}P{\^{o}}rto}, title = {Non-stationary Communication Dalays in Failure Detectors}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {16--21}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/NunesJ02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/PaulRCV02, author = {Ivan de Pa{\'{u}}l and Miquel Roca and Oscar Calvo and Raul Velazco}, title = {{SEU} fault injection in simulation environments: example of {VHDL} configuration on {FPGA} device}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {114--119}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 20 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/PaulRCV02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/PetrosjancKA02, author = {Konstantin O. Petrosjanc and Igor A. Kharitonov and Alexej S. Adonin}, title = {Multi-Level Testing Strategy for Radiation Hardened {SOI/SOS} ICs}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {199--204}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/PetrosjancKA02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/RebaudengoRV02, author = {Maurizio Rebaudengo and Matteo Sonza Reorda and Massimo Violante}, title = {A New Approach to Software-Implemented Fault Tolerance}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {22--25}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/RebaudengoRV02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Reorda02, author = {Matteo Sonza Reorda}, title = {An Overview Covering the Different Solutions: from radiation testing to Software Fault Injection}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {2}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Reorda02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/SantiagoOT02, author = {Alexandre S. Santiago and Arthur H. C. Oliveira and Rubens Takiguti}, title = {Built-in Self Code for Microcontroller Units}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {58--60}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/SantiagoOT02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/SantosT0MBF02, author = {Marcelino B. Santos and Isabel C. Teixeira and Jo{\~{a}}o Paulo Teixeira and Salvador Manich and Luz Balado and Joan Figueras}, title = {On High-Quality, Low Energy {BIST} Preparation at RT-Level}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {52--57}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/SantosT0MBF02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/SaxWM02, author = {Eric Sax and J. Willibald and Klaus D. M{\"{u}}ller{-}Glaser}, title = {Seamless Testing of Embedded Control Systems}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {151--153}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/SaxWM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/SoaresV02, author = {Inali Wisniewski Soares and Silvia Regina Vergilio}, title = {DMutation Analysis and Constraint-Based Criteria: Results from na Empirical Evaluation in the Context of Testing Software}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {33--38}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/SoaresV02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Ubar02, author = {Raimund Ubar}, title = {Testability Calculation for Digital Circuits with Decision Diagrams}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {137--143}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/Ubar02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/VazquezHRLH02, author = {Diego V{\'{a}}zquez and Gloria Huertas and Adoraci{\'{o}}n Rueda and Gildas L{\'{e}}ger and Jos{\'{e}} L. Huertas}, title = {Low-cost on-chip measurements for Oscillation-Based-Test in Analog Integrated Circuits}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {89--93}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/VazquezHRLH02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/VolpiV02, author = {Lisiane Maes Volpi and Silvia Regina Vergilio}, title = {Software Testing in Client-Server Environments: a Strategy and its Application}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {45--50}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/VolpiV02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/WangA02, author = {Li{-}C. Wang and Magdy S. Abadir}, title = {Validation and Verification of Complex Digital Systems: {A} Practical Perspective}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {1}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/WangA02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/ZentenoCR02, author = {Antonio Zenteno and V{\'{\i}}ctor H. Champac and Jaime Ram{\'{\i}}rez{-}Angulo}, title = {Behavior Analysis and Testing of Resistive Opens in the Clock Circuitry of Memory Elements}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {205--211}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/ZentenoCR02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/latw/2002, title = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/2002.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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